TechTalk: Benefits of high-resolution ICP-OES for challenging applications

Content of the web seminar

Duration: ~20 min
Language: English
Speakers:
​​Kilian Schneider, Product Specialist ICP-OES, Analytik Jena GmbH & Co.KG

Complex sample matrices can make trace element analysis challenging, particularly when spectral interferences limit confidence in results. In applications such as mining analysis, conventional ICP-OES approaches may not always provide the resolution needed to clearly separate overlapping signals or achieve the detection limits required for demanding workflows.

In this 20-minute TechTalk, discover how high-resolution ICP-OES can help overcome spectral interferences, improve confidence in elemental analysis, and deliver reliable results for complex samples. The session will show how enhanced spectral resolution, combined with strong sensitivity, can support more robust trace element detection where conventional approaches may reach their limits.

Designed for ICP-OES users, elemental analysis specialists, analytical chemists, method developers, laboratory managers, QC/QA professionals, and researchers working with complex sample matrices, this session will provide practical insight into how high-resolution ICP-OES can strengthen analytical performance and support confident decision-making in challenging applications.

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